Electron Energy-Loss Spectroscopic Imaging for Phase Detection in Organic Photovoltaics
نویسندگان
چکیده
Recent years have seen an ever increasing interest in organic photovoltaics (OPV) [1]. As a result there is a high scientific demand for microstructural characterization of the various fabricated devices. Here we introduce several new techniques for examining OPV materials in a (scanning) transmission electron microscope (TEM/STEM) capable of electron energy-loss spectroscopy (EELS). The materials under investigation are regio-regular poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester (PCBM) which form the most commonly used donor/acceptor blend[1].
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